Research for Distributed Automatic Test System
نویسندگان
چکیده
منابع مشابه
A Micro-Kernel Test Engine for Automatic Test System
In traditional automatic test solutions, a test engine usually encompasses all functions in its kernel, including compiling test program, generating test event chain, scheduling test process and executing test events. This makes the engine tightly coupled with test language and the system under test, so that it is difficult to maintain, optimize and extend the test engine. In order to solve the...
متن کاملA distributed test system for pipelined ADCs
The paper presents a distributed test system for pipelined ADCs including a modelbased characterization process. A set of modular Virtual Instruments has been developed in Java to execute the system functions in order to be remotely manageable through a common Internet browser. The system features include (i) a module able in modeling an ADC through the specialization of a simplified behavioral...
متن کاملTest Sequence Generation for Distributed Software System
This paper considers the test case generation for distributed software (a test case contains one or more test sequences). Applying the single finite state machine (FSM) test approach to distributed software, we will suffer from some problems: 1) the state combinatorial explosion problem; 2) some unexecutable test cases may be generated; 3) some fault may be masked and cannot be isolated accurat...
متن کاملAutomatic Generation of Test Purposes for Testing Distributed Systems
In this paper, we present an algorithm for generating test purpose descriptions in form of MSC’s from a given labeled event structure that represents the behavior of a system of asynchronously communicating extended finite state machines. The labeled event structure is a non-interleaving behavior model describing the behavior of a system in terms of the partial ordering of events.
متن کاملAn Automatic Test Environment for Microelectronics Education and Research
An automatic test environment (ATE) based on a PSoC has been developed to perform electrical characterization of integrated circuits (ICs). The ICs are designed for academic and research purposes as part of the Electronic Design graduate program at CINVESTAV-Guadalajara Unit; these ICs are manufactured in standard N-well, 5-V, 1.5μm/0.5μm CMOS technologies. The ATE offers programmable capabilit...
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ژورنال
عنوان ژورنال: Procedia Engineering
سال: 2011
ISSN: 1877-7058
DOI: 10.1016/j.proeng.2011.08.1165